Inproceedings,
Fine-grained fault tolerance using device checkpoints.
A. Kadav, M. Renzelmann, and M. Swift.ASPLOS, page 473-484. ACM, (2013)
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- BibTeX key
- conf/asplos/KadavRS13
- entry type
- inproceedings
- booktitle
- ASPLOS
- year
- 2013
- pages
- 473-484
- publisher
- ACM
- crossref
- conf/asplos/2013
- ee
- https://doi.org/10.1145/2490301.2451168
- isbn
- 978-1-4503-1870-9
- url
- http://dblp.uni-trier.de/db/conf/asplos/asplos2013.html#KadavRS13
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- please select -%0 Conference Paper
%1 conf/asplos/KadavRS13
%A Kadav, Asim
%A Renzelmann, Matthew J.
%A Swift, Michael M.
%B ASPLOS
%D 2013
%E Sarkar, Vivek
%E Bodík, Rastislav
%I ACM
%K dblp
%P 473-484
%T Fine-grained fault tolerance using device checkpoints.
%U http://dblp.uni-trier.de/db/conf/asplos/asplos2013.html#KadavRS13
%@ 978-1-4503-1870-9
@inproceedings{conf/asplos/KadavRS13,
added-at = {2021-07-07T00:00:00.000+0200},
author = {Kadav, Asim and Renzelmann, Matthew J. and Swift, Michael M.},
biburl = {https://www.bibsonomy.org/bibtex/27fb6a6b41d584f659c4e4e8c06c1386d/dblp},
booktitle = {ASPLOS},
crossref = {conf/asplos/2013},
editor = {Sarkar, Vivek and Bodík, Rastislav},
ee = {https://doi.org/10.1145/2490301.2451168},
interhash = {ebdbd83d3bb3c5ba253b7cd86c101287},
intrahash = {7fb6a6b41d584f659c4e4e8c06c1386d},
isbn = {978-1-4503-1870-9},
keywords = {dblp},
pages = {473-484},
publisher = {ACM},
timestamp = {2024-04-10T01:55:09.000+0200},
title = {Fine-grained fault tolerance using device checkpoints.},
url = {http://dblp.uni-trier.de/db/conf/asplos/asplos2013.html#KadavRS13},
year = 2013
}