It is argued that the key factor required to make vacuum
microelectronics successful is closely related to an understanding and
control of the physics, materials and microfabrication technology for
field emitter arrays (FEAs). The topics discussed are the optimization
and theoretical limit of the FEA; thermal stability of the FEA and the
mesoscopic FEA; fabrication and materials of FEAs; and characteristics
of FEAs. The author examines basic characteristics, limits and
capabilities of FEAs from the viewpoint of optimizing the concept of the
most current for the least voltage
Description
Welcome to IEEE Xplore 2.0: Vacuum microelectronics: what's new and exciting
%0 Journal Article
%1 Utsumi:1991
%A Utsumi, T.
%B Electron Devices, IEEE Transactions on
%D 1991
%K electricalengineering imported physics science thesis vacuum_microelectronics vacuum_tubes
%P 2276-2283
%R 10.1109/16.88510
%T Vacuum microelectronics: what's new and exciting
%U http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=88510
%V 38
%X It is argued that the key factor required to make vacuum
microelectronics successful is closely related to an understanding and
control of the physics, materials and microfabrication technology for
field emitter arrays (FEAs). The topics discussed are the optimization
and theoretical limit of the FEA; thermal stability of the FEA and the
mesoscopic FEA; fabrication and materials of FEAs; and characteristics
of FEAs. The author examines basic characteristics, limits and
capabilities of FEAs from the viewpoint of optimizing the concept of the
most current for the least voltage
@article{Utsumi:1991,
abstract = {It is argued that the key factor required to make vacuum
microelectronics successful is closely related to an understanding and
control of the physics, materials and microfabrication technology for
field emitter arrays (FEAs). The topics discussed are the optimization
and theoretical limit of the FEA; thermal stability of the FEA and the
mesoscopic FEA; fabrication and materials of FEAs; and characteristics
of FEAs. The author examines basic characteristics, limits and
capabilities of FEAs from the viewpoint of optimizing the concept of the
most current for the least voltage},
added-at = {2007-08-06T22:35:43.000+0200},
author = {Utsumi, T.},
biburl = {https://www.bibsonomy.org/bibtex/28bf36df765e7a6a6eae6c9b34c091cc5/essential.beatfinger},
booktitle = {Electron Devices, IEEE Transactions on},
description = {Welcome to IEEE Xplore 2.0: Vacuum microelectronics: what's new and exciting},
doi = {10.1109/16.88510},
interhash = {c2e3bac3a4c8bdc4a342dc2f7749a84f},
intrahash = {8bf36df765e7a6a6eae6c9b34c091cc5},
issn = {0018-9383},
keywords = {electricalengineering imported physics science thesis vacuum_microelectronics vacuum_tubes},
pages = {2276-2283},
timestamp = {2007-08-06T22:35:43.000+0200},
title = {Vacuum microelectronics: what's new and exciting},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=88510},
volume = 38,
year = 1991
}