%0 Journal Article %1 journals/tii/HeTZZM23 %A He, Shunfan %A Tian, Wei %A Zhu, Rongbo %A Zhang, Yan %A Mao, Sun %D 2023 %J IEEE Trans. Ind. Informatics %K dblp %N 7 %P 8351-8361 %T Electrical Signature Analysis for Open-Circuit Faults Detection of Inverter With Various Disturbances in Distribution Grid. %U http://dblp.uni-trier.de/db/journals/tii/tii19.html#HeTZZM23 %V 19

@article{journals/tii/HeTZZM23, added-at = {2023-07-07T00:00:00.000+0200}, author = {He, Shunfan and Tian, Wei and Zhu, Rongbo and Zhang, Yan and Mao, Sun}, biburl = {https://www.bibsonomy.org/bibtex/2fb4ef673499a235f1bf08b834cb7c173/dblp}, ee = {https://doi.org/10.1109/TII.2022.3217757}, interhash = {0e7b8e0b708efd9801b87b4d2577081f}, intrahash = {fb4ef673499a235f1bf08b834cb7c173}, journal = {IEEE Trans. Ind. Informatics}, keywords = {dblp}, month = {July}, number = 7, pages = {8351-8361}, timestamp = {2024-04-08T15:01:52.000+0200}, title = {Electrical Signature Analysis for Open-Circuit Faults Detection of Inverter With Various Disturbances in Distribution Grid.}, url = {http://dblp.uni-trier.de/db/journals/tii/tii19.html#HeTZZM23}, volume = 19, year = 2023 }