Inproceedings,
Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies.
S. Olowogemo, H. Qiu, B. Lin, W. Robinson, and D. Limbrick.DFT, page 1-4. IEEE, (2022)
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- conf/dft/OlowogemoQLRL22
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- inproceedings
- booktitle
- DFT
- year
- 2022
- pages
- 1-4
- publisher
- IEEE
- crossref
- conf/dft/2022
- ee
- https://doi.org/10.1109/DFT56152.2022.9962348
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- 978-1-6654-5938-9
- url
- http://dblp.uni-trier.de/db/conf/dft/dft2022.html#OlowogemoQLRL22
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- please select -%0 Conference Paper
%1 conf/dft/OlowogemoQLRL22
%A Olowogemo, Semiu A.
%A Qiu, Hao
%A Lin, Bor-Tyng
%A Robinson, William H.
%A Limbrick, Daniel B.
%B DFT
%D 2022
%E Cassano, Luca
%E Chakravarty, Sreejit
%E Bosio, Alberto
%I IEEE
%K dblp
%P 1-4
%T Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies.
%U http://dblp.uni-trier.de/db/conf/dft/dft2022.html#OlowogemoQLRL22
%@ 978-1-6654-5938-9
@inproceedings{conf/dft/OlowogemoQLRL22,
added-at = {2022-12-03T00:00:00.000+0100},
author = {Olowogemo, Semiu A. and Qiu, Hao and Lin, Bor-Tyng and Robinson, William H. and Limbrick, Daniel B.},
biburl = {https://www.bibsonomy.org/bibtex/26de3eb2a90eb11fdca9435ffcf61259a/dblp},
booktitle = {DFT},
crossref = {conf/dft/2022},
editor = {Cassano, Luca and Chakravarty, Sreejit and Bosio, Alberto},
ee = {https://doi.org/10.1109/DFT56152.2022.9962348},
interhash = {e1b5f60eee9e14121b7428b66d74dc00},
intrahash = {6de3eb2a90eb11fdca9435ffcf61259a},
isbn = {978-1-6654-5938-9},
keywords = {dblp},
pages = {1-4},
publisher = {IEEE},
timestamp = {2024-04-09T23:07:59.000+0200},
title = {Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies.},
url = {http://dblp.uni-trier.de/db/conf/dft/dft2022.html#OlowogemoQLRL22},
year = 2022
}