%0 Conference Paper %1 conf/cicc/AgarwalPR04 %A Agarwal, Amit %A Paul, Bipul C. %A Roy, Kaushik %B CICC %D 2004 %I IEEE %K dblp %P 353-356 %T Process variation in nano-scale memories: failure analysis and process tolerant architecture. %U http://dblp.uni-trier.de/db/conf/cicc/cicc2004.html#AgarwalPR04 %@ 0-7803-8495-4

@inproceedings{conf/cicc/AgarwalPR04, added-at = {2019-07-17T00:00:00.000+0200}, author = {Agarwal, Amit and Paul, Bipul C. and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/2923bd06a9902fd097574c76ff2367136/dblp}, booktitle = {CICC}, crossref = {conf/cicc/2004}, ee = {https://doi.org/10.1109/CICC.2004.1358819}, interhash = {ce875d46edebef8e31a501ad2fe6ed24}, intrahash = {923bd06a9902fd097574c76ff2367136}, isbn = {0-7803-8495-4}, keywords = {dblp}, pages = {353-356}, publisher = {IEEE}, timestamp = {2019-10-17T23:06:23.000+0200}, title = {Process variation in nano-scale memories: failure analysis and process tolerant architecture.}, url = {http://dblp.uni-trier.de/db/conf/cicc/cicc2004.html#AgarwalPR04}, year = 2004 }