%0 Journal Article %1 journals/mr/LiuSFYHL17 %A Liu, Fan %A Su, Lei %A Fan, Mengying %A Yin, Jian %A He, Zhenzhi %A Lu, Xiangning %D 2017 %J Microelectron. Reliab. %K dblp %P 166-174 %T Using scanning acoustic microscopy and LM-BP algorithm for defect inspection of micro solder bumps. %U http://dblp.uni-trier.de/db/journals/mr/mr79.html#LiuSFYHL17 %V 79

@article{journals/mr/LiuSFYHL17, added-at = {2020-03-02T00:00:00.000+0100}, author = {Liu, Fan and Su, Lei and Fan, Mengying and Yin, Jian and He, Zhenzhi and Lu, Xiangning}, biburl = {https://www.bibsonomy.org/bibtex/23300938082c4f15c8decfb4a5d57e203/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.10.029}, interhash = {021472d972aa056f5601cc950e4b8631}, intrahash = {3300938082c4f15c8decfb4a5d57e203}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {166-174}, timestamp = {2020-03-03T12:11:15.000+0100}, title = {Using scanning acoustic microscopy and LM-BP algorithm for defect inspection of micro solder bumps.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr79.html#LiuSFYHL17}, volume = 79, year = 2017 }