%0 Journal Article %1 journals/mr/LiuZLZHN17 %A Liu, Jizhi %A Zeng, Yaohui %A Liu, Zhiwei %A Zhao, Jianming %A Hui, Cheng %A Nie, Liu %D 2017 %J Microelectron. Reliab. %K dblp %P 122-128 %T Low-voltage triggering SCRs for ESD protection in a 0.35 μm SiGe BiCMOS process. %U http://dblp.uni-trier.de/db/journals/mr/mr73.html#LiuZLZHN17 %V 73

@article{journals/mr/LiuZLZHN17, added-at = {2020-02-22T00:00:00.000+0100}, author = {Liu, Jizhi and Zeng, Yaohui and Liu, Zhiwei and Zhao, Jianming and Hui, Cheng and Nie, Liu}, biburl = {https://www.bibsonomy.org/bibtex/27e00ea1802796883b53e809fecc49145/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.04.029}, interhash = {0310056e4a618ae0966c9363d2796c6a}, intrahash = {7e00ea1802796883b53e809fecc49145}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {122-128}, timestamp = {2020-02-25T13:25:01.000+0100}, title = {Low-voltage triggering SCRs for ESD protection in a 0.35 μm SiGe BiCMOS process.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr73.html#LiuZLZHN17}, volume = 73, year = 2017 }