Article,
Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology.
Z. Gao, M. Hu, R. Baert, B. Chehab, J. Swenton, S. Malagi, J. Huisken, K. Goossens, and E. Marinissen.IEEE Des. Test, 41 (2): 56-64 (2024)
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- article
- year
- 2024
- journal
- IEEE Des. Test
- number
- 2
- pages
- 56-64
- volume
- 41
- ee
- https://doi.org/10.1109/MDAT.2023.3294872
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- http://dblp.uni-trier.de/db/journals/dt/dt41.html#Gao0BCSMHGM24
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%1 journals/dt/Gao0BCSMHGM24
%A Gao, Zhan
%A Hu, Min-Chun
%A Baert, Rogier
%A Chehab, Bilal
%A Swenton, Joe
%A Malagi, Santosh
%A Huisken, Jos
%A Goossens, Kees
%A Marinissen, Erik Jan
%D 2024
%J IEEE Des. Test
%K dblp
%N 2
%P 56-64
%T Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology.
%U http://dblp.uni-trier.de/db/journals/dt/dt41.html#Gao0BCSMHGM24
%V 41
@article{journals/dt/Gao0BCSMHGM24,
added-at = {2024-03-16T00:00:00.000+0100},
author = {Gao, Zhan and Hu, Min-Chun and Baert, Rogier and Chehab, Bilal and Swenton, Joe and Malagi, Santosh and Huisken, Jos and Goossens, Kees and Marinissen, Erik Jan},
biburl = {https://www.bibsonomy.org/bibtex/2020ea25a969e08093beb8f6dbc0d6dac/dblp},
ee = {https://doi.org/10.1109/MDAT.2023.3294872},
interhash = {047fc28f4ab3ebf77d04e3efaf2fe8a1},
intrahash = {020ea25a969e08093beb8f6dbc0d6dac},
journal = {IEEE Des. Test},
keywords = {dblp},
number = 2,
pages = {56-64},
timestamp = {2024-04-09T04:12:51.000+0200},
title = {Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology.},
url = {http://dblp.uni-trier.de/db/journals/dt/dt41.html#Gao0BCSMHGM24},
volume = 41,
year = 2024
}