%0 Conference Paper %1 conf/dac/SrivastavaSASBD05 %A Srivastava, Ashish %A Shah, Saumil %A Agarwal, Kanak %A Sylvester, Dennis %A Blaauw, David T. %A Director, Stephen W. %B DAC %D 2005 %E Jr., William H. Joyner %E Martin, Grant %E Kahng, Andrew B. %I ACM %K dblp %P 535-540 %T Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance. %U http://dblp.uni-trier.de/db/conf/dac/dac2005.html#SrivastavaSASBD05 %@ 1-59593-058-2

@inproceedings{conf/dac/SrivastavaSASBD05, added-at = {2018-11-06T00:00:00.000+0100}, author = {Srivastava, Ashish and Shah, Saumil and Agarwal, Kanak and Sylvester, Dennis and Blaauw, David T. and Director, Stephen W.}, biburl = {https://www.bibsonomy.org/bibtex/23b4405f786fce7937165821027e5673e/dblp}, booktitle = {DAC}, crossref = {conf/dac/2005}, editor = {Jr., William H. Joyner and Martin, Grant and Kahng, Andrew B.}, ee = {https://doi.org/10.1145/1065579.1065718}, interhash = {056c1f10fb189b301fc82cba3a1e7c16}, intrahash = {3b4405f786fce7937165821027e5673e}, isbn = {1-59593-058-2}, keywords = {dblp}, pages = {535-540}, publisher = {ACM}, timestamp = {2018-11-07T15:13:09.000+0100}, title = {Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac2005.html#SrivastavaSASBD05}, year = 2005 }