%0 Journal Article %1 journals/ieicet/HigamiTKS13 %A Higami, Yoshinobu %A Takahashi, Hiroshi %A ya Kobayashi, Shin %A Saluja, Kewal K. %D 2013 %J IEICE Trans. Inf. Syst. %K dblp %N 6 %P 1323-1331 %T Test Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet96d.html#HigamiTKS13 %V 96-D

@article{journals/ieicet/HigamiTKS13, added-at = {2020-04-11T00:00:00.000+0200}, author = {Higami, Yoshinobu and Takahashi, Hiroshi and ya Kobayashi, Shin and Saluja, Kewal K.}, biburl = {https://www.bibsonomy.org/bibtex/23b3878c22e40c63b05d343428202fdd9/dblp}, ee = {http://search.ieice.org/bin/summary.php?id=e96-d_6_1323}, interhash = {06164c286add006d2e4fe9b8eafc9f05}, intrahash = {3b3878c22e40c63b05d343428202fdd9}, journal = {IEICE Trans. Inf. Syst.}, keywords = {dblp}, number = 6, pages = {1323-1331}, timestamp = {2020-04-14T11:59:55.000+0200}, title = {Test Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet96d.html#HigamiTKS13}, volume = {96-D}, year = 2013 }