%0 Journal Article %1 journals/et/CarvalhoBSRB14 %A de Carvalho, Mauricio %A Bernardi, Paolo %A Sánchez, Ernesto %A Reorda, Matteo Sonza %A Ballan, Oscar %D 2014 %J J. Electron. Test. %K dblp %N 3 %P 317-328 %T Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test. %U http://dblp.uni-trier.de/db/journals/et/et30.html#CarvalhoBSRB14 %V 30

@article{journals/et/CarvalhoBSRB14, added-at = {2021-07-25T00:00:00.000+0200}, author = {de Carvalho, Mauricio and Bernardi, Paolo and Sánchez, Ernesto and Reorda, Matteo Sonza and Ballan, Oscar}, biburl = {https://www.bibsonomy.org/bibtex/27bd90fdb8220fef002efc6e63ed0e454/dblp}, ee = {https://www.wikidata.org/entity/Q60245487}, interhash = {07922d61e74e66b82f2e67147549cfc9}, intrahash = {7bd90fdb8220fef002efc6e63ed0e454}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 3, pages = {317-328}, timestamp = {2024-04-08T20:52:34.000+0200}, title = {Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test.}, url = {http://dblp.uni-trier.de/db/journals/et/et30.html#CarvalhoBSRB14}, volume = 30, year = 2014 }