%0 Journal Article %1 journals/tcas/BrendlerZMR20 %A Brendler, Leonardo Heitich %A Zimpeck, Alexandra L. %A Meinhardt, Cristina %A da Luz Reis, Ricardo Augusto %D 2020 %J IEEE Trans. Circuits Syst. I Regul. Pap. %K dblp %N 2 %P 553-564 %T Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology. %U http://dblp.uni-trier.de/db/journals/tcas/tcasI67.html#BrendlerZMR20 %V 67-I

@article{journals/tcas/BrendlerZMR20, added-at = {2022-01-03T00:00:00.000+0100}, author = {Brendler, Leonardo Heitich and Zimpeck, Alexandra L. and Meinhardt, Cristina and da Luz Reis, Ricardo Augusto}, biburl = {https://www.bibsonomy.org/bibtex/2e116ba9236f4d0c4b76b9d2457405270/dblp}, ee = {https://doi.org/10.1109/TCSI.2019.2927374}, interhash = {07d7ee7943fa69947a7a69c22f532012}, intrahash = {e116ba9236f4d0c4b76b9d2457405270}, journal = {IEEE Trans. Circuits Syst. I Regul. Pap.}, keywords = {dblp}, number = 2, pages = {553-564}, timestamp = {2024-04-09T06:13:27.000+0200}, title = {Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology.}, url = {http://dblp.uni-trier.de/db/journals/tcas/tcasI67.html#BrendlerZMR20}, volume = {67-I}, year = 2020 }