%0 Journal Article %1 journals/mr/LimKSBKSO05 %A Lim, Jihyuk %A Kuk, Keon %A joo Shin, Seung %A soon Baek, Seog %A Kim, Youngjae %A Shin, Jong-Woo %A Oh, Yongsoo %D 2005 %J Microelectron. Reliab. %K dblp %N 3-4 %P 473-478 %T Failure mechanisms in thermal inkjet printhead analyzed by experiments and numerical simulation. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#LimKSBKSO05 %V 45

@article{journals/mr/LimKSBKSO05, added-at = {2020-02-22T00:00:00.000+0100}, author = {Lim, Jihyuk and Kuk, Keon and joo Shin, Seung and soon Baek, Seog and Kim, Youngjae and Shin, Jong-Woo and Oh, Yongsoo}, biburl = {https://www.bibsonomy.org/bibtex/2abd3af38591ec5e790aaa2d952107f61/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.12.009}, interhash = {08dbb528da2989a1c7085173865df59a}, intrahash = {abd3af38591ec5e790aaa2d952107f61}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {3-4}, pages = {473-478}, timestamp = {2020-02-25T13:30:08.000+0100}, title = {Failure mechanisms in thermal inkjet printhead analyzed by experiments and numerical simulation.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#LimKSBKSO05}, volume = 45, year = 2005 }