%0 Journal Article %1 journals/ieicet/HigamiSTKT09 %A Higami, Yoshinobu %A Saluja, Kewal K. %A Takahashi, Hiroshi %A ya Kobayashi, Shin %A Takamatsu, Yuzo %D 2009 %J IEICE Trans. Fundam. Electron. Commun. Comput. Sci. %K dblp %N 12 %P 3128-3135 %T Addressing Defect Coverage through Generating Test Vectors for Transistor Defects. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet92a.html#HigamiSTKT09 %V 92-A

@article{journals/ieicet/HigamiSTKT09, added-at = {2020-04-11T00:00:00.000+0200}, author = {Higami, Yoshinobu and Saluja, Kewal K. and Takahashi, Hiroshi and ya Kobayashi, Shin and Takamatsu, Yuzo}, biburl = {https://www.bibsonomy.org/bibtex/21f516ec636eb160d400704f4c1a44c88/dblp}, ee = {http://search.ieice.org/bin/summary.php?id=e92-a_12_3128}, interhash = {0d598b1bc1a90230d9ad7cb8e1edc0cb}, intrahash = {1f516ec636eb160d400704f4c1a44c88}, journal = {IEICE Trans. Fundam. Electron. Commun. Comput. Sci.}, keywords = {dblp}, number = 12, pages = {3128-3135}, timestamp = {2020-04-14T11:48:52.000+0200}, title = {Addressing Defect Coverage through Generating Test Vectors for Transistor Defects.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet92a.html#HigamiSTKT09}, volume = {92-A}, year = 2009 }