%0 Conference Paper %1 conf/ewdts/BuslowskaY18 %A Buslowska, Eugenia %A Yarmolik, Vyacheslav N. %B EWDTS %D 2018 %I IEEE %K dblp %P 1-6 %T Multi-Run March Tests for Pattern Sensitive Faults in RAM. %U http://dblp.uni-trier.de/db/conf/ewdts/ewdts2018.html#BuslowskaY18 %@ 978-1-5386-5710-2

@inproceedings{conf/ewdts/BuslowskaY18, added-at = {2019-11-13T00:00:00.000+0100}, author = {Buslowska, Eugenia and Yarmolik, Vyacheslav N.}, biburl = {https://www.bibsonomy.org/bibtex/2aedeb3d4291dc3383bdbd358e97bdd8a/dblp}, booktitle = {EWDTS}, crossref = {conf/ewdts/2018}, ee = {https://doi.org/10.1109/EWDTS.2018.8524643}, interhash = {15817a61422a5e2e28c0214d1f642b33}, intrahash = {aedeb3d4291dc3383bdbd358e97bdd8a}, isbn = {978-1-5386-5710-2}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-09T12:10:25.000+0200}, title = {Multi-Run March Tests for Pattern Sensitive Faults in RAM.}, url = {http://dblp.uni-trier.de/db/conf/ewdts/ewdts2018.html#BuslowskaY18}, year = 2018 }