%0 Journal Article %1 journals/mr/GuoWRLLJWH18 %A Guo, Shaofeng %A Wang, Runsheng %A Ren, Pengpeng %A Liu, Changze %A Luo, Mulong %A Jiang, Xiaobo %A Wang, Yangyuan %A Huang, Ru %D 2018 %J Microelectron. Reliab. %K dblp %P 101-111 %T Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits. %U http://dblp.uni-trier.de/db/journals/mr/mr81.html#GuoWRLLJWH18 %V 81

@article{journals/mr/GuoWRLLJWH18, added-at = {2020-02-22T00:00:00.000+0100}, author = {Guo, Shaofeng and Wang, Runsheng and Ren, Pengpeng and Liu, Changze and Luo, Mulong and Jiang, Xiaobo and Wang, Yangyuan and Huang, Ru}, biburl = {https://www.bibsonomy.org/bibtex/2bf83cd3961a80204ae48127d573df396/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.11.028}, interhash = {1620e440c1fd7ba07a6d7db79d8bd435}, intrahash = {bf83cd3961a80204ae48127d573df396}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {101-111}, timestamp = {2020-02-25T13:25:30.000+0100}, title = {Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr81.html#GuoWRLLJWH18}, volume = 81, year = 2018 }