%0 Journal Article %1 journals/tvlsi/ChenMBR05 %A Chen, Qikai %A Mahmoodi-Meimand, Hamid %A Bhunia, Swarup %A Roy, Kaushik %D 2005 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 11 %P 1286-1295 %T Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi13.html#ChenMBR05 %V 13

@article{journals/tvlsi/ChenMBR05, added-at = {2024-05-07T00:00:00.000+0200}, author = {Chen, Qikai and Mahmoodi-Meimand, Hamid and Bhunia, Swarup and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/2f50bcd5df3a05d614a79bcb856261084/dblp}, ee = {https://doi.org/10.1109/TVLSI.2005.859565}, interhash = {17f8185c1b746bb9dbd80289555ceacf}, intrahash = {f50bcd5df3a05d614a79bcb856261084}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 11, pages = {1286-1295}, timestamp = {2024-05-13T07:13:35.000+0200}, title = {Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi13.html#ChenMBR05}, volume = 13, year = 2005 }