%0 Journal Article %1 journals/dt/LinPRRRST03 %A Lin, Xijiang %A Press, Ron %A Rajski, Janusz %A Reuter, Paul %A Rinderknecht, Thomas %A Swanson, Bruce %A Tamarapalli, Nagesh %D 2003 %J IEEE Des. Test Comput. %K dblp %N 5 %P 17-25 %T High-Frequency, At-Speed Scan Testing. %U http://dblp.uni-trier.de/db/journals/dt/dt20.html#LinPRRRST03 %V 20

@article{journals/dt/LinPRRRST03, added-at = {2020-05-17T00:00:00.000+0200}, author = {Lin, Xijiang and Press, Ron and Rajski, Janusz and Reuter, Paul and Rinderknecht, Thomas and Swanson, Bruce and Tamarapalli, Nagesh}, biburl = {https://www.bibsonomy.org/bibtex/24c240fae1e0bc053857b86484d3ca8cd/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1232252}, interhash = {1bb837e7458435cc0e5454fae40476fc}, intrahash = {4c240fae1e0bc053857b86484d3ca8cd}, journal = {IEEE Des. Test Comput.}, keywords = {dblp}, number = 5, pages = {17-25}, timestamp = {2020-05-19T12:21:25.000+0200}, title = {High-Frequency, At-Speed Scan Testing.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt20.html#LinPRRRST03}, volume = 20, year = 2003 }