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%0 Conference Paper
%1 conf/eurodac/Rodriguez-MontanesF94
%A Rodríguez-Montañés, Rosa
%A Figueras, Joan
%B EDAC-ETC-EUROASIC
%D 1994
%E Werner, Robert
%I IEEE Computer Society
%K dblp
%P 356-360
%T Analysis of Bridging Defects in Sequential CMOS Circuits and their Current Testability.
%U http://dblp.uni-trier.de/db/conf/eurodac/eurodac1994.html#Rodriguez-MontanesF94
%@ 0-8186-5410-4
@inproceedings{conf/eurodac/Rodriguez-MontanesF94,
added-at = {2017-05-24T00:00:00.000+0200},
author = {Rodríguez-Montañés, Rosa and Figueras, Joan},
biburl = {https://www.bibsonomy.org/bibtex/2a03f0231154fce0d26ad6ec8ea22ff0e/dblp},
booktitle = {EDAC-ETC-EUROASIC},
crossref = {conf/eurodac/1994edac},
editor = {Werner, Robert},
ee = {https://doi.org/10.1109/EDTC.1994.326852},
interhash = {1da6db7ba0a0ca00f319715ed4e987cc},
intrahash = {a03f0231154fce0d26ad6ec8ea22ff0e},
isbn = {0-8186-5410-4},
keywords = {dblp},
pages = {356-360},
publisher = {IEEE Computer Society},
timestamp = {2019-10-17T22:26:24.000+0200},
title = {Analysis of Bridging Defects in Sequential CMOS Circuits and their Current Testability.},
url = {http://dblp.uni-trier.de/db/conf/eurodac/eurodac1994.html#Rodriguez-MontanesF94},
year = 1994
}
