%0 Journal Article %1 journals/tc/Savir80 %A Savir, Jacob %D 1980 %J IEEE Trans. Computers %K dblp %N 5 %P 410-416 %T Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection. %U http://dblp.uni-trier.de/db/journals/tc/tc29.html#Savir80 %V 29

@article{journals/tc/Savir80, added-at = {2015-12-22T00:00:00.000+0100}, author = {Savir, Jacob}, biburl = {https://www.bibsonomy.org/bibtex/265da1b664c5808fdc1d8e3a7dd385834/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/TC.1980.1675595}, interhash = {1ff8b417b5312e4ec77811c750c3bea1}, intrahash = {65da1b664c5808fdc1d8e3a7dd385834}, journal = {IEEE Trans. Computers}, keywords = {dblp}, number = 5, pages = {410-416}, timestamp = {2015-12-24T12:07:25.000+0100}, title = {Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection.}, url = {http://dblp.uni-trier.de/db/journals/tc/tc29.html#Savir80}, volume = 29, year = 1980 }