%0 Journal Article %1 journals/et/NguyenRC99 %A Nguyen, Huy %A Roy, Rabindra K. %A Chatterjee, Abhijit %D 1999 %J J. Electron. Test. %K dblp %N 3 %P 259-272 %T Partial Reset Methodology and Experiments for Improving Random-Pattern Testability and BIST of Sequential Circuits. %U http://dblp.uni-trier.de/db/journals/et/et14.html#NguyenRC99 %V 14

@article{journals/et/NguyenRC99, added-at = {2020-09-11T00:00:00.000+0200}, author = {Nguyen, Huy and Roy, Rabindra K. and Chatterjee, Abhijit}, biburl = {https://www.bibsonomy.org/bibtex/28f7546ef57a59245a7e55dacfbfd9c67/dblp}, ee = {https://doi.org/10.1023/A:1008366304699}, interhash = {2010b766d12cb1e09a114dab2af84be6}, intrahash = {8f7546ef57a59245a7e55dacfbfd9c67}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 3, pages = {259-272}, timestamp = {2020-09-12T11:40:53.000+0200}, title = {Partial Reset Methodology and Experiments for Improving Random-Pattern Testability and BIST of Sequential Circuits.}, url = {http://dblp.uni-trier.de/db/journals/et/et14.html#NguyenRC99}, volume = 14, year = 1999 }