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- BibTeX key
- conf/icmla/ZhouQXLCLYLLSHH23
- entry type
- inproceedings
- booktitle
- ICMLA
- year
- 2023
- pages
- 1595-1600
- publisher
- IEEE
- crossref
- conf/icmla/2023
- ee
- https://doi.org/10.1109/ICMLA58977.2023.00241
- isbn
- 979-8-3503-4534-6
- url
- http://dblp.uni-trier.de/db/conf/icmla/icmla2023.html#ZhouQXLCLYLLSHH23
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- please select -%0 Conference Paper
%1 conf/icmla/ZhouQXLCLYLLSHH23
%A Zhou, Longfei
%A Qin, Zhanghao
%A Xia, Ping
%A Liu, Jiabao
%A Cheng, Weihao
%A Li, Yunwei
%A Ying, Leyi
%A Liu, Qian
%A Liu, Mengxin
%A Song, Gezhang
%A Huang, Zebo
%A Hao, Zhou
%B ICMLA
%D 2023
%I IEEE
%K dblp
%P 1595-1600
%T General Model for Manufacturing Defect Detection Crossing Multiple Products.
%U http://dblp.uni-trier.de/db/conf/icmla/icmla2023.html#ZhouQXLCLYLLSHH23
%@ 979-8-3503-4534-6
@inproceedings{conf/icmla/ZhouQXLCLYLLSHH23,
added-at = {2024-04-12T00:00:00.000+0200},
author = {Zhou, Longfei and Qin, Zhanghao and Xia, Ping and Liu, Jiabao and Cheng, Weihao and Li, Yunwei and Ying, Leyi and Liu, Qian and Liu, Mengxin and Song, Gezhang and Huang, Zebo and Hao, Zhou},
biburl = {https://www.bibsonomy.org/bibtex/2b318aa12afa9e9d350ee56690241cc01/dblp},
booktitle = {ICMLA},
crossref = {conf/icmla/2023},
ee = {https://doi.org/10.1109/ICMLA58977.2023.00241},
interhash = {23d7706133c308fa9a33c3f940e102ac},
intrahash = {b318aa12afa9e9d350ee56690241cc01},
isbn = {979-8-3503-4534-6},
keywords = {dblp},
pages = {1595-1600},
publisher = {IEEE},
timestamp = {2024-04-15T07:05:38.000+0200},
title = {General Model for Manufacturing Defect Detection Crossing Multiple Products.},
url = {http://dblp.uni-trier.de/db/conf/icmla/icmla2023.html#ZhouQXLCLYLLSHH23},
year = 2023
}