%0 Journal Article %1 journals/mr/Martin-MartinezPPG01 %A Martín-Martínez, M. J. %A Pérez, Susana %A Pardo, Daniel %A González, Tomás %D 2001 %J Microelectron. Reliab. %K dblp %N 6 %P 847-854 %T High injection effects on noise characteristics of Si BJTs and SiGe HBTs. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#Martin-MartinezPPG01 %V 41

@article{journals/mr/Martin-MartinezPPG01, added-at = {2020-10-26T00:00:00.000+0100}, author = {Martín-Martínez, M. J. and Pérez, Susana and Pardo, Daniel and González, Tomás}, biburl = {https://www.bibsonomy.org/bibtex/227f8c56966df34175b2e356a6eb74e97/dblp}, ee = {https://doi.org/10.1016/S0026-2714(01)00022-1}, interhash = {24472039974a8dacd64666304060a07f}, intrahash = {27f8c56966df34175b2e356a6eb74e97}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 6, pages = {847-854}, timestamp = {2020-10-27T12:44:52.000+0100}, title = {High injection effects on noise characteristics of Si BJTs and SiGe HBTs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#Martin-MartinezPPG01}, volume = 41, year = 2001 }