%0 Conference Paper %1 conf/ewdts/AndjelkovicSKK18 %A Andjelkovic, Marko S. %A Stamenkovic, Zoran %A Krstic, Milos %A Kraemer, Rolf %B EWDTS %D 2018 %I IEEE %K dblp %P 1-6 %T Impact of Resistive Open and Bridge Defects on the SET Robustness of Standard CMOS Combinational Logic. %U http://dblp.uni-trier.de/db/conf/ewdts/ewdts2018.html#AndjelkovicSKK18 %@ 978-1-5386-5710-2

@inproceedings{conf/ewdts/AndjelkovicSKK18, added-at = {2024-02-05T00:00:00.000+0100}, author = {Andjelkovic, Marko S. and Stamenkovic, Zoran and Krstic, Milos and Kraemer, Rolf}, biburl = {https://www.bibsonomy.org/bibtex/25bb62ba74dfdd3419099ad0a181faea9/dblp}, booktitle = {EWDTS}, crossref = {conf/ewdts/2018}, ee = {https://doi.org/10.1109/EWDTS.2018.8524748}, interhash = {249d7d8e202180f43fd14550e8f3ac2f}, intrahash = {5bb62ba74dfdd3419099ad0a181faea9}, isbn = {978-1-5386-5710-2}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-09T12:10:25.000+0200}, title = {Impact of Resistive Open and Bridge Defects on the SET Robustness of Standard CMOS Combinational Logic.}, url = {http://dblp.uni-trier.de/db/conf/ewdts/ewdts2018.html#AndjelkovicSKK18}, year = 2018 }