%0 Conference Paper %1 conf/ets/JaniLVDTB19 %A Jani, Imed %A Lattard, Didier %A Vivet, Pascal %A Durupt, Jean %A Thuries, Sébastien %A Beigné, Edith %B ETS %D 2019 %I IEEE %K dblp %P 1-2 %T Test Solutions for High Density 3D-IC Interconnects - Focus on SRAM-on-Logic Partitioning. %U http://dblp.uni-trier.de/db/conf/ets/ets2019.html#JaniLVDTB19 %@ 978-1-7281-1173-5

@inproceedings{conf/ets/JaniLVDTB19, added-at = {2024-05-07T00:00:00.000+0200}, author = {Jani, Imed and Lattard, Didier and Vivet, Pascal and Durupt, Jean and Thuries, Sébastien and Beigné, Edith}, biburl = {https://www.bibsonomy.org/bibtex/26fef70087b335900ff36f751c6f551a7/dblp}, booktitle = {ETS}, crossref = {conf/ets/2019}, ee = {https://doi.org/10.1109/ETS.2019.8791531}, interhash = {2971147b6686a7d7d5c455c31a292c1a}, intrahash = {6fef70087b335900ff36f751c6f551a7}, isbn = {978-1-7281-1173-5}, keywords = {dblp}, pages = {1-2}, publisher = {IEEE}, timestamp = {2024-05-13T10:05:03.000+0200}, title = {Test Solutions for High Density 3D-IC Interconnects - Focus on SRAM-on-Logic Partitioning.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2019.html#JaniLVDTB19}, year = 2019 }