%0 Conference Paper %1 conf/itc/BenwareSRMKTTR03 %A Benware, Brady %A Schuermyer, Chris %A Ranganathan, Sreenevasan %A Madge, Robert %A Krishnamurthy, Prabhu %A Tamarapalli, Nagesh %A Tsai, Kun-Han %A Rajski, Janusz %B ITC %D 2003 %I IEEE Computer Society %K dblp %P 1031-1040 %T Impact of Multiple-Detect Test Patterns on Product Quality. %U http://dblp.uni-trier.de/db/conf/itc/itc2003.html#BenwareSRMKTTR03 %@ 0-7803-8106-8

@inproceedings{conf/itc/BenwareSRMKTTR03, added-at = {2023-03-23T00:00:00.000+0100}, author = {Benware, Brady and Schuermyer, Chris and Ranganathan, Sreenevasan and Madge, Robert and Krishnamurthy, Prabhu and Tamarapalli, Nagesh and Tsai, Kun-Han and Rajski, Janusz}, biburl = {https://www.bibsonomy.org/bibtex/2994e16629502047960ba6155daac264a/dblp}, booktitle = {ITC}, crossref = {conf/itc/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271091}, interhash = {2c98a8cc38541c64dc37a31441ab61d8}, intrahash = {994e16629502047960ba6155daac264a}, isbn = {0-7803-8106-8}, keywords = {dblp}, pages = {1031-1040}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:31.000+0200}, title = {Impact of Multiple-Detect Test Patterns on Product Quality.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2003.html#BenwareSRMKTTR03}, year = 2003 }