%0 Conference Paper %1 conf/cp/AzevedoB98 %A Azevedo, Francisco %A Barahona, Pedro %B CP %D 1998 %E Maher, Michael J. %E Puget, Jean-Francois %I Springer %K dblp %P 462 %T Generation of Test Patterns for Differential Diagnosis of Digital Circuits. %U http://dblp.uni-trier.de/db/conf/cp/cp98.html#AzevedoB98 %V 1520 %@ 3-540-65224-8

@inproceedings{conf/cp/AzevedoB98, added-at = {2018-11-02T00:00:00.000+0100}, author = {Azevedo, Francisco and Barahona, Pedro}, biburl = {https://www.bibsonomy.org/bibtex/2ae63ceeb7477b9b9e0db80e913a4a362/dblp}, booktitle = {CP}, crossref = {conf/cp/1998}, editor = {Maher, Michael J. and Puget, Jean-Francois}, ee = {https://doi.org/10.1007/3-540-49481-2_33}, interhash = {2cde83ec9519058720de58187b97b22d}, intrahash = {ae63ceeb7477b9b9e0db80e913a4a362}, isbn = {3-540-65224-8}, keywords = {dblp}, pages = 462, publisher = {Springer}, series = {Lecture Notes in Computer Science}, timestamp = {2019-05-15T15:18:47.000+0200}, title = {Generation of Test Patterns for Differential Diagnosis of Digital Circuits.}, url = {http://dblp.uni-trier.de/db/conf/cp/cp98.html#AzevedoB98}, volume = 1520, year = 1998 }