%0 Journal Article %1 journals/mr/YanYHLY01 %A Yan, B. P. %A Yang, Y. F. %A Hsu, C. C. %A Lo, H. B. %A Yang, E. S. %D 2001 %J Microelectron. Reliab. %K dblp %N 12 %P 1959-1963 %T A reliability comparison of InGaP/GaAs HBTs with and without passivation ledge. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#YanYHLY01 %V 41

@article{journals/mr/YanYHLY01, added-at = {2020-02-22T00:00:00.000+0100}, author = {Yan, B. P. and Yang, Y. F. and Hsu, C. C. and Lo, H. B. and Yang, E. S.}, biburl = {https://www.bibsonomy.org/bibtex/21f4b01f58031912275043cd25c2fd66d/dblp}, ee = {https://doi.org/10.1016/S0026-2714(01)00222-0}, interhash = {2e958854cbe12142d15f5e829132e635}, intrahash = {1f4b01f58031912275043cd25c2fd66d}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 12, pages = {1959-1963}, timestamp = {2020-02-25T13:27:17.000+0100}, title = {A reliability comparison of InGaP/GaAs HBTs with and without passivation ledge.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#YanYHLY01}, volume = 41, year = 2001 }