%0 Conference Paper %1 conf/ats/HurSLSLK96 %A Hur, Y.-M. %A Shin, J.-H. %A Lee, K.-H. %A Son, Y.-S. %A Lim, I.-C. %A Kim, Y.-H. %B Asian Test Symposium %D 1996 %I IEEE Computer Society %K dblp %P 42- %T Efficient Path Delay Fault Test Generation Algorithms for Weighted Random Robust Testing. %U http://dblp.uni-trier.de/db/conf/ats/ats1996.html#HurSLSLK96 %@ 0-8186-7478-4

@inproceedings{conf/ats/HurSLSLK96, added-at = {2023-03-24T00:00:00.000+0100}, author = {Hur, Y.-M. and Shin, J.-H. and Lee, K.-H. and Son, Y.-S. and Lim, I.-C. and Kim, Y.-H.}, biburl = {https://www.bibsonomy.org/bibtex/29a17f121495424a993093c0213eff3a4/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1996}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1996.10002}, interhash = {2fc464806463252b9f3865b796b510fc}, intrahash = {9a17f121495424a993093c0213eff3a4}, isbn = {0-8186-7478-4}, keywords = {dblp}, pages = {42-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:35:50.000+0200}, title = {Efficient Path Delay Fault Test Generation Algorithms for Weighted Random Robust Testing.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1996.html#HurSLSLK96}, year = 1996 }