%0 Journal Article %1 journals/mr/Rodriguez-Fernandez18 %A Rodriguez-Fernandez, Alberto %A Muñoz-Gorriz, J. %A Suñé, Jordi %A Miranda, Enrique %D 2018 %J Microelectron. Reliab. %K dblp %P 142-146 %T A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory. %U http://dblp.uni-trier.de/db/journals/mr/mr88.html#Rodriguez-Fernandez18 %V 88-90

@article{journals/mr/Rodriguez-Fernandez18, added-at = {2021-09-20T00:00:00.000+0200}, author = {Rodriguez-Fernandez, Alberto and Muñoz-Gorriz, J. and Suñé, Jordi and Miranda, Enrique}, biburl = {https://www.bibsonomy.org/bibtex/22001896041e2721ee71ef5e8b679161e/dblp}, ee = {https://doi.org/10.1016/j.microrel.2018.06.120}, interhash = {302355dd75dbfc6e116b44c9bf90100b}, intrahash = {2001896041e2721ee71ef5e8b679161e}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {142-146}, timestamp = {2024-04-09T02:48:37.000+0200}, title = {A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr88.html#Rodriguez-Fernandez18}, volume = {88-90}, year = 2018 }