%0 Conference Paper %1 conf/vts/PanZLCG19 %A Pan, Renjian %A Zhang, Zhaobo %A Li, Xin %A Chakrabarty, Krishnendu %A Gu, Xinli %B VTS %D 2019 %I IEEE %K dblp %P 1-6 %T Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model. %U http://dblp.uni-trier.de/db/conf/vts/vts2019.html#PanZLCG19 %@ 978-1-7281-1170-4

@inproceedings{conf/vts/PanZLCG19, added-at = {2022-01-03T00:00:00.000+0100}, author = {Pan, Renjian and Zhang, Zhaobo and Li, Xin and Chakrabarty, Krishnendu and Gu, Xinli}, biburl = {https://www.bibsonomy.org/bibtex/2550c94b60b7dad6821071ffc21e52f77/dblp}, booktitle = {VTS}, crossref = {conf/vts/2019}, ee = {https://doi.org/10.1109/VTS.2019.8758639}, interhash = {3245e08fc328b210fd160970f7c4c552}, intrahash = {550c94b60b7dad6821071ffc21e52f77}, isbn = {978-1-7281-1170-4}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-10T19:42:08.000+0200}, title = {Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2019.html#PanZLCG19}, year = 2019 }