%0 Journal Article %1 journals/mr/WeiLYCW10 %A Wei, Chen %A Liu, Yong Chang %A Yu, Li Ming %A Chen, Hao %A Wang, Xun %D 2010 %J Microelectron. Reliab. %K dblp %N 8 %P 1142-1145 %T Effects of Al on the failure mechanism of the Sn-Ag-Zn eutectic solder. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#WeiLYCW10 %V 50

@article{journals/mr/WeiLYCW10, added-at = {2021-05-26T00:00:00.000+0200}, author = {Wei, Chen and Liu, Yong Chang and Yu, Li Ming and Chen, Hao and Wang, Xun}, biburl = {https://www.bibsonomy.org/bibtex/21aad5ae2ee4cfe36b7a049580440847e/dblp}, ee = {https://doi.org/10.1016/j.microrel.2010.04.023}, interhash = {3391d071adadfbdd43fee49997cecc8e}, intrahash = {1aad5ae2ee4cfe36b7a049580440847e}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 8, pages = {1142-1145}, timestamp = {2024-04-09T02:50:06.000+0200}, title = {Effects of Al on the failure mechanism of the Sn-Ag-Zn eutectic solder.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#WeiLYCW10}, volume = 50, year = 2010 }