%0 Journal Article %1 journals/ieicet/IchiharaSYI10 %A Ichihara, Hideyuki %A Sutoh, Kenta %A Yoshikawa, Yuki %A Inoue, Tomoo %D 2010 %J IEICE Trans. Inf. Syst. %K dblp %N 10 %P 2776-2782 %T A Practical Threshold Test Generation for Error Tolerant Application. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet93d.html#IchiharaSYI10 %V 93-D

@article{journals/ieicet/IchiharaSYI10, added-at = {2020-04-11T00:00:00.000+0200}, author = {Ichihara, Hideyuki and Sutoh, Kenta and Yoshikawa, Yuki and Inoue, Tomoo}, biburl = {https://www.bibsonomy.org/bibtex/289c4e4ebf5f40433764e8fcac7797745/dblp}, ee = {http://search.ieice.org/bin/summary.php?id=e93-d_10_2776}, interhash = {36377a50511808be7080054c4e35c1f3}, intrahash = {89c4e4ebf5f40433764e8fcac7797745}, journal = {IEICE Trans. Inf. Syst.}, keywords = {dblp}, number = 10, pages = {2776-2782}, timestamp = {2020-04-14T11:56:34.000+0200}, title = {A Practical Threshold Test Generation for Error Tolerant Application.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet93d.html#IchiharaSYI10}, volume = {93-D}, year = 2010 }