%0 Conference Paper %1 conf/vlsit/DongSYLXLCWWZWR23 %A Dong, Zuoyuan %A Sun, Zixuan %A Yang, Xin %A Li, Xiaomei %A Xue, Yongkang %A Luo, Chen %A Cai, Puyang %A Wang, Zirui %A Wang, Shuying %A Zhang, Yewei %A Wang, Chaolun %A Ren, Pengpeng %A Ji, Zhigang %A Wu, Xing %A Wang, Runsheng %A Huang, Ru %B VLSI Technology and Circuits %D 2023 %I IEEE %K dblp %P 1-2 %T Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence. %U http://dblp.uni-trier.de/db/conf/vlsit/vlsit2023.html#DongSYLXLCWWZWR23 %@ 978-4-86348-806-9

@inproceedings{conf/vlsit/DongSYLXLCWWZWR23, added-at = {2023-12-22T00:00:00.000+0100}, author = {Dong, Zuoyuan and Sun, Zixuan and Yang, Xin and Li, Xiaomei and Xue, Yongkang and Luo, Chen and Cai, Puyang and Wang, Zirui and Wang, Shuying and Zhang, Yewei and Wang, Chaolun and Ren, Pengpeng and Ji, Zhigang and Wu, Xing and Wang, Runsheng and Huang, Ru}, biburl = {https://www.bibsonomy.org/bibtex/2830602e59d8b06a4ecd7bc8388b53cd8/dblp}, booktitle = {VLSI Technology and Circuits}, crossref = {conf/vlsit/2023}, ee = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185380}, interhash = {38dc69d5a015b1e44074afd79b8c7050}, intrahash = {830602e59d8b06a4ecd7bc8388b53cd8}, isbn = {978-4-86348-806-9}, keywords = {dblp}, pages = {1-2}, publisher = {IEEE}, timestamp = {2024-04-09T19:13:01.000+0200}, title = {Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence.}, url = {http://dblp.uni-trier.de/db/conf/vlsit/vlsit2023.html#DongSYLXLCWWZWR23}, year = 2023 }