%0 Conference Paper %1 conf/ats/UedaSIS20 %A Ueda, Aoi %A Shintani, Michihiro %A Inoue, Michiko %A Sato, Takashi %B ATS %D 2020 %I IEEE %K dblp %P 1-6 %T Measurement of BTI-induced Threshold Voltage Shift for Power MOSFETs under Switching Operation. %U http://dblp.uni-trier.de/db/conf/ats/ats2020.html#UedaSIS20 %@ 978-1-7281-7467-9

@inproceedings{conf/ats/UedaSIS20, added-at = {2024-05-07T00:00:00.000+0200}, author = {Ueda, Aoi and Shintani, Michihiro and Inoue, Michiko and Sato, Takashi}, biburl = {https://www.bibsonomy.org/bibtex/2c3797757ec95cdf3047e7c828934a949/dblp}, booktitle = {ATS}, crossref = {conf/ats/2020}, ee = {https://doi.org/10.1109/ATS49688.2020.9301598}, interhash = {3da2464d2f39eac97c25fbcc62653afa}, intrahash = {c3797757ec95cdf3047e7c828934a949}, isbn = {978-1-7281-7467-9}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-05-13T08:34:01.000+0200}, title = {Measurement of BTI-induced Threshold Voltage Shift for Power MOSFETs under Switching Operation.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2020.html#UedaSIS20}, year = 2020 }