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%0 Journal Article
%1 journals/mr/PhangCOKCPGS03
%A Phang, J. C. H.
%A Chan, D. S. H.
%A Ong, V. K. S.
%A Kolachina, S.
%A Chin, J. M.
%A Palaniappan, M.
%A Gilfeather, G.
%A Seah, Y. X.
%D 2003
%J Microelectron. Reliab.
%K dblp
%N 9-11
%P 1595-1602
%T Single contact beam induced current phenomenon for microelectronic failure analysis.
%U http://dblp.uni-trier.de/db/journals/mr/mr43.html#PhangCOKCPGS03
%V 43
@article{journals/mr/PhangCOKCPGS03,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Phang, J. C. H. and Chan, D. S. H. and Ong, V. K. S. and Kolachina, S. and Chin, J. M. and Palaniappan, M. and Gilfeather, G. and Seah, Y. X.},
biburl = {https://www.bibsonomy.org/bibtex/28daf6bf282694d8c36984e0686497572/dblp},
ee = {https://doi.org/10.1016/S0026-2714(03)00280-4},
interhash = {43de967ebf82ff83dba53816c8ad85a6},
intrahash = {8daf6bf282694d8c36984e0686497572},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-11},
pages = {1595-1602},
timestamp = {2020-02-25T13:25:08.000+0100},
title = {Single contact beam induced current phenomenon for microelectronic failure analysis.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#PhangCOKCPGS03},
volume = 43,
year = 2003
}