%0 Conference Paper %1 conf/itc/BransonMS88 %A Branson, Christopher W. %A Murray, Don %A Sullivan, Steve %B ITC %D 1988 %I IEEE Computer Society %K dblp %P 23-27 %T Integrated Pin Electronics for a VLSI Test System. %U http://dblp.uni-trier.de/db/conf/itc/itc1988.html#BransonMS88 %@ 0-8186-0870-6

@inproceedings{conf/itc/BransonMS88, added-at = {2017-05-24T00:00:00.000+0200}, author = {Branson, Christopher W. and Murray, Don and Sullivan, Steve}, biburl = {https://www.bibsonomy.org/bibtex/269421cb18e79bb4299ec705f5b64d72a/dblp}, booktitle = {ITC}, crossref = {conf/itc/1988}, ee = {https://doi.org/10.1109/TEST.1988.207776}, interhash = {53543548888070e764e534b626e57031}, intrahash = {69421cb18e79bb4299ec705f5b64d72a}, isbn = {0-8186-0870-6}, keywords = {dblp}, pages = {23-27}, publisher = {IEEE Computer Society}, timestamp = {2019-02-14T11:45:31.000+0100}, title = {Integrated Pin Electronics for a VLSI Test System.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1988.html#BransonMS88}, year = 1988 }