%0 Journal Article %1 journals/ieicet/InoueTYF12 %A Inoue, Michiko %A Taketani, Akira %A Yoneda, Tomokazu %A Fujiwara, Hideo %D 2012 %J IEICE Trans. Inf. Syst. %K dblp %N 12 %P 3001-3009 %T Test Pattern Ordering and Selection for High Quality Test Set under Constraints. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet95d.html#InoueTYF12 %V 95-D

@article{journals/ieicet/InoueTYF12, added-at = {2020-04-11T00:00:00.000+0200}, author = {Inoue, Michiko and Taketani, Akira and Yoneda, Tomokazu and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/20504f87cd876b870ecaa095b8e9b69f4/dblp}, ee = {http://search.ieice.org/bin/summary.php?id=e95-d_12_3001}, interhash = {53ffd6458ef3f152d54b3f8bf3a52fc8}, intrahash = {0504f87cd876b870ecaa095b8e9b69f4}, journal = {IEICE Trans. Inf. Syst.}, keywords = {dblp}, number = 12, pages = {3001-3009}, timestamp = {2020-04-14T11:45:35.000+0200}, title = {Test Pattern Ordering and Selection for High Quality Test Set under Constraints.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet95d.html#InoueTYF12}, volume = {95-D}, year = 2012 }