%0 Journal Article %1 journals/mr/WangSWBCL17 %A Wang, Haibin %A Sheng, Ao %A Wang, Shiqi %A Bi, Jinshun %A Chen, Li %A Liu, Xiaofeng %D 2017 %J Microelectron. Reliab. %K dblp %P 39-44 %T SEU reduction effectiveness of common centroid layout in differential latch at 130-nm CMOS technology. %U http://dblp.uni-trier.de/db/journals/mr/mr72.html#WangSWBCL17 %V 72

@article{journals/mr/WangSWBCL17, added-at = {2022-10-26T00:00:00.000+0200}, author = {Wang, Haibin and Sheng, Ao and Wang, Shiqi and Bi, Jinshun and Chen, Li and Liu, Xiaofeng}, biburl = {https://www.bibsonomy.org/bibtex/2427c7b4de2b8b580d61bba5d58a20b83/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.04.003}, interhash = {56a329bd46af7bf49ae5dbfec85c9c7e}, intrahash = {427c7b4de2b8b580d61bba5d58a20b83}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {39-44}, timestamp = {2024-04-09T02:49:59.000+0200}, title = {SEU reduction effectiveness of common centroid layout in differential latch at 130-nm CMOS technology.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr72.html#WangSWBCL17}, volume = 72, year = 2017 }