Article,
Electronic circuit reliability modeling.
J. Bernstein, M. Gurfinkel, X. Li, J. Walters, Y. Shapira, and M. Talmor.Microelectron. Reliab., 46 (12): 1957-1979 (2006)
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- journals/mr/BernsteinGLWST06
- entry type
- article
- year
- 2006
- journal
- Microelectron. Reliab.
- number
- 12
- pages
- 1957-1979
- volume
- 46
- ee
- https://doi.org/10.1016/j.microrel.2005.12.004
- url
- http://dblp.uni-trier.de/db/journals/mr/mr46.html#BernsteinGLWST06
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- please select -%0 Journal Article
%1 journals/mr/BernsteinGLWST06
%A Bernstein, Joseph B.
%A Gurfinkel, Moshe
%A Li, Xiaojun
%A Walters, Jörg
%A Shapira, Yoram
%A Talmor, Michael
%D 2006
%J Microelectron. Reliab.
%K dblp
%N 12
%P 1957-1979
%T Electronic circuit reliability modeling.
%U http://dblp.uni-trier.de/db/journals/mr/mr46.html#BernsteinGLWST06
%V 46
@article{journals/mr/BernsteinGLWST06,
added-at = {2023-09-30T00:00:00.000+0200},
author = {Bernstein, Joseph B. and Gurfinkel, Moshe and Li, Xiaojun and Walters, Jörg and Shapira, Yoram and Talmor, Michael},
biburl = {https://www.bibsonomy.org/bibtex/2648024b64022b11a823190080a284c2e/dblp},
ee = {https://doi.org/10.1016/j.microrel.2005.12.004},
interhash = {5e2c3ad58e8e2b41744c754b7e2820ea},
intrahash = {648024b64022b11a823190080a284c2e},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = 12,
pages = {1957-1979},
timestamp = {2024-04-09T02:49:44.000+0200},
title = {Electronic circuit reliability modeling.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#BernsteinGLWST06},
volume = 46,
year = 2006
}