%0 Conference Paper %1 conf/ats/MaedaK00 %A Maeda, Toshiyuki %A Kinoshita, Kozo %B Asian Test Symposium %D 2000 %I IEEE Computer Society %K dblp %P 350-355 %T Memory reduction of IDDQ test compaction for internal and external bridging faults. %U http://dblp.uni-trier.de/db/conf/ats/ats2000.html#MaedaK00 %@ 0-7695-0887-1

@inproceedings{conf/ats/MaedaK00, added-at = {2023-03-24T00:00:00.000+0100}, author = {Maeda, Toshiyuki and Kinoshita, Kozo}, biburl = {https://www.bibsonomy.org/bibtex/26abdec37f1e7afccc9c8f3461b0772bf/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2000}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2000.893648}, interhash = {5f9d265cb78080e47fd8e28f8bb73ae8}, intrahash = {6abdec37f1e7afccc9c8f3461b0772bf}, isbn = {0-7695-0887-1}, keywords = {dblp}, pages = {350-355}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:42.000+0200}, title = {Memory reduction of IDDQ test compaction for internal and external bridging faults.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2000.html#MaedaK00}, year = 2000 }