%0 Journal Article %1 journals/mr/YangB09 %A Yang, Liyu %A Bernstein, Joseph B. %D 2009 %J Microelectron. Reliab. %K dblp %N 12 %P 1563-1572 %T Failure rate estimation of known failure mechanisms of electronic packages. %U http://dblp.uni-trier.de/db/journals/mr/mr49.html#YangB09 %V 49

@article{journals/mr/YangB09, added-at = {2023-09-30T00:00:00.000+0200}, author = {Yang, Liyu and Bernstein, Joseph B.}, biburl = {https://www.bibsonomy.org/bibtex/23ff4e095e9f2f49617f5e0160bbbaa7e/dblp}, ee = {https://doi.org/10.1016/j.microrel.2009.06.005}, interhash = {62a5c56065dbfb3601a544f4f3134fa6}, intrahash = {3ff4e095e9f2f49617f5e0160bbbaa7e}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 12, pages = {1563-1572}, timestamp = {2024-04-09T02:48:51.000+0200}, title = {Failure rate estimation of known failure mechanisms of electronic packages.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr49.html#YangB09}, volume = 49, year = 2009 }