Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Journal Article
%1 journals/jors/ChanM08
%A Chan, A.
%A McNaught, Ken R.
%D 2008
%J J. Oper. Res. Soc.
%K dblp
%N 4
%P 423-430
%T Using Bayesian networks to improve fault diagnosis during manufacturing tests of mobile telephone infrastructure.
%U http://dblp.uni-trier.de/db/journals/jors/jors59.html#ChanM08
%V 59
@article{journals/jors/ChanM08,
added-at = {2020-09-04T00:00:00.000+0200},
author = {Chan, A. and McNaught, Ken R.},
biburl = {https://www.bibsonomy.org/bibtex/21b432847c13daacff0c6dbe2d2bc6690/dblp},
ee = {https://doi.org/10.1057/palgrave.jors.2602388},
interhash = {66fb14048cbd374f3d6e57285607629a},
intrahash = {1b432847c13daacff0c6dbe2d2bc6690},
journal = {J. Oper. Res. Soc.},
keywords = {dblp},
number = 4,
pages = {423-430},
timestamp = {2020-09-09T12:10:36.000+0200},
title = {Using Bayesian networks to improve fault diagnosis during manufacturing tests of mobile telephone infrastructure.},
url = {http://dblp.uni-trier.de/db/journals/jors/jors59.html#ChanM08},
volume = 59,
year = 2008
}