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%0 Conference Paper
%1 conf/dac/KangKIAR07
%A Kang, Kunhyuk
%A Kim, Keejong
%A Islam, Ahmad E.
%A Alam, Muhammad Ashraful
%A Roy, Kaushik
%B DAC
%D 2007
%I IEEE
%K dblp
%P 358-363
%T Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement.
%U http://dblp.uni-trier.de/db/conf/dac/dac2007.html#KangKIAR07
@inproceedings{conf/dac/KangKIAR07,
added-at = {2018-11-06T00:00:00.000+0100},
author = {Kang, Kunhyuk and Kim, Keejong and Islam, Ahmad E. and Alam, Muhammad Ashraful and Roy, Kaushik},
biburl = {https://www.bibsonomy.org/bibtex/26b32b9dfb18a6df01d365eb5809ebfd4/dblp},
booktitle = {DAC},
crossref = {conf/dac/2007},
ee = {https://doi.org/10.1145/1278480.1278572},
interhash = {6cbd2ee0a98a07fc26f00b196a041aa5},
intrahash = {6b32b9dfb18a6df01d365eb5809ebfd4},
keywords = {dblp},
pages = {358-363},
publisher = {IEEE},
timestamp = {2018-11-07T15:12:28.000+0100},
title = {Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement.},
url = {http://dblp.uni-trier.de/db/conf/dac/dac2007.html#KangKIAR07},
year = 2007
}
