%0 Conference Paper %1 conf/itc/SavirMV85 %A Savir, Jacob %A McAnney, William H. %A Vecchio, Salvatore R. %B ITC %D 1985 %I IEEE Computer Society %K dblp %P 100-105 %T Random Pattern Testing for Data-Line Faults in an Embedded Multiport Memory. %U http://dblp.uni-trier.de/db/conf/itc/itc1985.html#SavirMV85

@inproceedings{conf/itc/SavirMV85, added-at = {2002-11-11T00:00:00.000+0100}, author = {Savir, Jacob and McAnney, William H. and Vecchio, Salvatore R.}, biburl = {https://www.bibsonomy.org/bibtex/20bac625499ccac90620388bba0ef886a/dblp}, booktitle = {ITC}, crossref = {conf/itc/1985}, date = {2002-11-11}, description = {dblp}, interhash = {6ddc8ab2b5aa7b17df09edf37504dbb7}, intrahash = {0bac625499ccac90620388bba0ef886a}, keywords = {dblp}, pages = {100-105}, publisher = {IEEE Computer Society}, timestamp = {2002-11-11T00:00:00.000+0100}, title = {Random Pattern Testing for Data-Line Faults in an Embedded Multiport Memory.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1985.html#SavirMV85}, year = 1985 }