%0 Journal Article %1 journals/ieiceee/NiCQH18 %A Ni, Tianming %A Chang, Hao %A Qi, Haochen %A Huang, Zhengfeng %D 2018 %J IEICE Electron. Express %K dblp %N 23 %P 20180873 %T A novel in-field TSV repair method for latent faults. %U http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee15.html#NiCQH18 %V 15

@article{journals/ieiceee/NiCQH18, added-at = {2021-02-12T00:00:00.000+0100}, author = {Ni, Tianming and Chang, Hao and Qi, Haochen and Huang, Zhengfeng}, biburl = {https://www.bibsonomy.org/bibtex/263db8af9c515f5eb06d83edae9671782/dblp}, ee = {https://doi.org/10.1587/elex.15.20180873}, interhash = {6ff78b01f2e044e2ac9e1357b5b8b67d}, intrahash = {63db8af9c515f5eb06d83edae9671782}, journal = {IEICE Electron. Express}, keywords = {dblp}, number = 23, pages = 20180873, timestamp = {2024-04-09T06:49:24.000+0200}, title = {A novel in-field TSV repair method for latent faults.}, url = {http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee15.html#NiCQH18}, volume = 15, year = 2018 }