%0 Journal Article %1 journals/tcad/DasBD12 %A Das, Sourasis %A Banerjee, Ansuman %A Dasgupta, Pallab %D 2012 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 3 %P 447-451 %T Early Analysis of Critical Faults: An Approach to Test Generation From Formal Specifications. %U http://dblp.uni-trier.de/db/journals/tcad/tcad31.html#DasBD12 %V 31

@article{journals/tcad/DasBD12, added-at = {2020-09-24T00:00:00.000+0200}, author = {Das, Sourasis and Banerjee, Ansuman and Dasgupta, Pallab}, biburl = {https://www.bibsonomy.org/bibtex/23183db3bc77eaa56d707be6b3ff07858/dblp}, ee = {https://doi.org/10.1109/TCAD.2011.2171183}, interhash = {73d4a94baaec7a7a07497aefc5f2a500}, intrahash = {3183db3bc77eaa56d707be6b3ff07858}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 3, pages = {447-451}, timestamp = {2020-09-25T11:48:22.000+0200}, title = {Early Analysis of Critical Faults: An Approach to Test Generation From Formal Specifications.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad31.html#DasBD12}, volume = 31, year = 2012 }