Пожалуйста, войдите в систему, чтобы принять участие в дискуссии (добавить собственные рецензию, или комментарий)
Цитировать эту публикацию
%0 Journal Article
%1 journals/mr/CzernyKWL10
%A Czerny, Bernhard
%A Khatibi, Golta
%A Weiss, Brigitte
%A Licht, T.
%D 2010
%J Microelectron. Reliab.
%K dblp
%N 9-11
%P 1641-1644
%T A fast test technique for life time estimation of ultrasonically welded Cu-Cu interconnects.
%U http://dblp.uni-trier.de/db/journals/mr/mr50.html#CzernyKWL10
%V 50
@article{journals/mr/CzernyKWL10,
added-at = {2023-08-15T00:00:00.000+0200},
author = {Czerny, Bernhard and Khatibi, Golta and Weiss, Brigitte and Licht, T.},
biburl = {https://www.bibsonomy.org/bibtex/2ce3519cab36ec54a23158fe099d79146/dblp},
ee = {https://doi.org/10.1016/j.microrel.2010.07.130},
interhash = {7797ca40e7d9872b39ac1760ab55a75b},
intrahash = {ce3519cab36ec54a23158fe099d79146},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-11},
pages = {1641-1644},
timestamp = {2024-04-09T02:48:59.000+0200},
title = {A fast test technique for life time estimation of ultrasonically welded Cu-Cu interconnects.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#CzernyKWL10},
volume = 50,
year = 2010
}