Inproceedings,
Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization.
H. Amrouch, K. Chakrabarty, D. Pflüger, I. Polian, M. Sauer, and M. Reorda.ETS, page 1-6. IEEE, (2022)
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- BibTeX key
- conf/ets/AmrouchCPPSR22
- entry type
- inproceedings
- booktitle
- ETS
- year
- 2022
- pages
- 1-6
- publisher
- IEEE
- crossref
- conf/ets/2022
- ee
- https://doi.org/10.1109/ETS54262.2022.9810416
- isbn
- 978-1-6654-6706-3
- url
- http://dblp.uni-trier.de/db/conf/ets/ets2022.html#AmrouchCPPSR22
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- please select -%0 Conference Paper
%1 conf/ets/AmrouchCPPSR22
%A Amrouch, Hussam
%A Chakrabarty, Krishnendu
%A Pflüger, Dirk
%A Polian, Ilia
%A Sauer, Matthias
%A Reorda, Matteo Sonza
%B ETS
%D 2022
%I IEEE
%K dblp
%P 1-6
%T Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization.
%U http://dblp.uni-trier.de/db/conf/ets/ets2022.html#AmrouchCPPSR22
%@ 978-1-6654-6706-3
@inproceedings{conf/ets/AmrouchCPPSR22,
added-at = {2023-03-21T00:00:00.000+0100},
author = {Amrouch, Hussam and Chakrabarty, Krishnendu and Pflüger, Dirk and Polian, Ilia and Sauer, Matthias and Reorda, Matteo Sonza},
biburl = {https://www.bibsonomy.org/bibtex/2580c04c24b88853713058b9343ba1ab0/dblp},
booktitle = {ETS},
crossref = {conf/ets/2022},
ee = {https://doi.org/10.1109/ETS54262.2022.9810416},
interhash = {77ccfe537aed9d8d7c34ac0ec18e2462},
intrahash = {580c04c24b88853713058b9343ba1ab0},
isbn = {978-1-6654-6706-3},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE},
timestamp = {2024-04-09T13:19:37.000+0200},
title = {Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization.},
url = {http://dblp.uni-trier.de/db/conf/ets/ets2022.html#AmrouchCPPSR22},
year = 2022
}