%0 Conference Paper %1 conf/etfa/SchlosserBFK19 %A Schlosser, Tobias %A Beuth, Frederik %A Friedrich, Michael %A Kowerko, Danny %B ETFA %D 2019 %I IEEE %K dblp %P 1511-1514 %T A Novel Visual Fault Detection and Classification System for Semiconductor Manufacturing Using Stacked Hybrid Convolutional Neural Networks. %U http://dblp.uni-trier.de/db/conf/etfa/etfa2019.html#SchlosserBFK19 %@ 978-1-7281-0303-7

@inproceedings{conf/etfa/SchlosserBFK19, added-at = {2023-06-26T00:00:00.000+0200}, author = {Schlosser, Tobias and Beuth, Frederik and Friedrich, Michael and Kowerko, Danny}, biburl = {https://www.bibsonomy.org/bibtex/20ae24a0ce3e9dc6fff2cda24b6eacc11/dblp}, booktitle = {ETFA}, crossref = {conf/etfa/2019}, ee = {https://doi.org/10.1109/ETFA.2019.8869311}, interhash = {7bc32bb69421ce5dbd4399596cf8dada}, intrahash = {0ae24a0ce3e9dc6fff2cda24b6eacc11}, isbn = {978-1-7281-0303-7}, keywords = {dblp}, pages = {1511-1514}, publisher = {IEEE}, timestamp = {2024-04-10T12:00:37.000+0200}, title = {A Novel Visual Fault Detection and Classification System for Semiconductor Manufacturing Using Stacked Hybrid Convolutional Neural Networks.}, url = {http://dblp.uni-trier.de/db/conf/etfa/etfa2019.html#SchlosserBFK19}, year = 2019 }